Xe+ FIB Milling and Measurement of Amorphous Damage in Diamond
Source abstract
Abstract
Brandon Van Leer, Ron Kelley, Arda Genc, Aleksei Savenko; Xe+ FIB Milling and Measurement of Amorphous Damage in Diamond, Microscopy and Microanalysis, Vol
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Diamond and Carbon-based Materials Research · Force Microscopy Techniques and Applications · Advanced Surface Polishing Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (5)
Show source-provided references
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3. 10.1016/j.diamond.2011.06.02210.1016/j.diamond.2011.06.022 ↗
4. Microscopy & Microanalysis · 2013 · 110
5. 10.1063/1.115018510.1063/1.1150185 ↗