XPS Spectromicroscopy as an Optimised Technique for Materials Characterisation.
Source abstract
Abstract
D Surman, C Moffitt, A J Roberts, S J Coultas, J D P Counsell, C J Blomfield; XPS Spectromicroscopy as an Optimised Technique for Materials Characterisatio
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Surface and Thin Film Phenomena · Iron oxide chemistry and applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. 10.1002/sia.573810.1002/sia.5738 ↗
2. Surf. Interface Anal. · 2005 · 38 · 69
3. 10.1002/sia.273110.1002/sia.2731 ↗