RISE Microscopy: Correlative Raman and SEM Imaging
Source abstract
Abstract
Ute Schmidt, Olaf Hollricher, Wei Liu, Edward L Principe; RISE Microscopy: Correlative Raman and SEM Imaging, Microscopy and Microanalysis, Volume 21, Issu
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Ion-surface interactions and analysis · Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
Reference metadata was not supplied for this record.