Simulating Inelastic Scattering in Scanning Transmission Electron Microscopy using μSTEM
Source abstract
Abstract
AJ D’Alfonso, SD Findlay, LJ Allen; Simulating Inelastic Scattering in Scanning Transmission Electron Microscopy using μSTEM, Microscopy and Microanalysis,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Semiconductor materials and devices · Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications
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References (4)
Show source-provided references
1. 10.1038/nmat408710.1038/nmat4087 ↗
2. Ultramicroscopy · 2014
3. 10.1038/2160210.1038/21602 ↗
4. 10.1103/PhysRevLett.101.23610210.1103/PhysRevLett.101.236102 ↗