FIB Applications: A Historical Perspective
Source abstract
Abstract
F A Stevie, L A Giannuzzi; FIB Applications: A Historical Perspective, Microscopy and Microanalysis, Volume 20, Issue S3, 1 August 2014, Pages 294–295, htt
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Advanced Electron Microscopy Techniques and Applications · Advanced Surface Polishing Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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