DataVXMicroscopy and MicroanalysisPaper
journal article·2009-07Open access

Mapping Polarization Fields in Al0.85In0.15N/AlN/GaN Heterostructures

L Zhou, DA Cullen, DJ Smith, A Mouti, M Gonschorek, E Feltin, JF Carlin, N Grandjean, MR McCartney

Microscopy and Microanalysis· Volume 15· Issue S2
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Source abstract

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: GaN-based semiconductor devices and materials

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