journal article·2014-08

Angle-resolved Valence EELS of a Single Crystal Gold Sample

Marek Malac, Koji Kimoto, Ray Egerton, Prashant Shekhar, Zubin Jacob, Yoshifumi Taniguchi, Vaibhav Gaind

Microscopy and Microanalysis· Volume 20· Issue S3
Publisher page

Abstract

Electron energy loss spectroscopy (EELS) in a TEM can measure the optical response of individual nanostructures at high spatial resolution [1] and obtain structure and morphology of the individual nanostructures. Here we show that high quality valence EELS (VEELS) can be acquired and interpreted to well below 2 eV in an instrument equipped with a cold field emission gun (CFEG) and a standard Gatan Image Filter (GIF) TridiemTM. We provide interpretation of the main spectral feature in the momentum-resolved EELS (qEELS) spectrum.
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Research context

OpenAlex topics: Electrochemical Analysis and Applications · Force Microscopy Techniques and Applications · Advanced Materials Characterization Techniques

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