journal article·2010-07Open access

HAADF STEM and EELS Investigations of Grain Boundaries in SrTiO3

KJ Dudeck, M Couillard, DJH Cockayne, GA Botton

Microscopy and Microanalysis· Volume 16· Issue S2

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Electronic and Structural Properties of Oxides · Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques

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References

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