journal article·2023-07-22Open access

Liquid Helium TEM Sample Holder with High Stability and Long Hold Times

Emily Rennich, Suk Hyun Sung, Nishkarsh Agarwal, Robert Hovden, Ismail El Baggari

Microscopy and Microanalysis· Volume 29· Issue Supplement_1

Abstract

Here, we introduce a novel ultra-low-temperature TEM sample holder compatible with liquid helium. The holder, which can be loaded into modern S/TEM microscopes, achieves sub-35 K base temperatures with ±2 mK thermal stability continuously over +8-hour periods. A charge density wave transition in 2H-NbSe2 with a transition temperature of ∼35 K was detected, highlighting the capability of the instrument for the study of phase transitions in quantum materials. Despite S/TEM’s incredible potential for the exploration of quantum materials or radiation-sensitive matter, shortcomings in current ultra-low-temperature designs make these materials difficult or impossible to study. Rapid advancement of cryogenic TEM techniques has occurred over the past 10 years, and atomic-resolution STEM study of low-temperature phenomena has been demonstrated with success at liquid nitrogen (LN2) temperature [1, 2], and even near liquid helium (LHe) temperature [3]. Common cryogenic instrumentation includes cartridge-based microscopes with built-in cryogenic capabilities, superconducting lenses [4, 5], or low-temperature side-entry sample holders [6]. Cartridge-based LN2 microscopes are ideal for many life-sciences applications but lack capabilities suitable for materials science [7]. Meanwhile, low-temperature side-entry holders suffer from severe mechanical and thermal instabilities as well as very short hold-times due to rapid evaporation of the cryogen from attached lightweight dewars. LHe is much more volatile than LN2, exacerbating all the issues found in current side-entry holders. A modular solution that enables stable, low-temperature imaging in modern TEMs is required for widespread investigation of quantum and radiation-sensitive materials. Here, we design and develop an ultra-low-temperature TEM sample holder that achieves high stability and long holding times. To demonstrate ultra-low temperatures within a modern TEM, measurements of 2H-NbSe2 are performed using a double-corrected JEOL 3100R05 operating at 300 kV. NbSe2 is a layered transition metal dichalcogenide exhibiting both charge density wave (CDW) ordering below 35 K and superconductivity below 7 K [8]. CDW formation is characterized by the appearance of superlattice peaks in reciprocal space. Fig. 1a shows an electron diffraction pattern at 300 K from a thin exfoliated flake. Bragg peaks with the symmetry of the crystal are prominent. At temperatures below 35 K achieved by our holder, we observe the formation of additional superlattice peaks (Fig. 1b, circles) indicating the emergence of the CDW. The peaks are located at 1/3 reciprocal lattice units. In addition to low base temperatures, this LHe instrument allows a high level of temperature control without compromising thermal stability. By adjusting the flow of helium or applying careful heating, any temperature between room and base temperature can be reached with a stability of ±2 mK or better. This capability has been demonstrated, reaching ±1.4 mK and ±2.0 mK stability at 11 K and 110 K, respectively (see Fig. 2). Here, the temperature stability is held over four hours; however, hold times exceeding eight hours can be achieved. These long hold times present a substantial opportunity for measurements that require long experimental durations including spectroscopy, tomography, and 4D STEM. The ability to easily reach intermediate temperatures also affords a great deal of flexibility: materials can now be reliably characterized at any desired temperature, not just those near the boiling point of cryogenic liquids [9]. The emergence of CDW superlattice peaks in 2H-NbSe2 below 35 K, shown in reciprocal space. a. Diffraction pattern captured at 300 K shows the room-temperature phase. b. Diffraction pattern captured below 35 K shows emergent superlattice peaks indicated by white circles. Temperature fluctuation distribution (top) over a period of four hours (bottom). All measurements were taken using a calibrated Si diode sensor on the cold finger. a. A temperature stability of ±1.4 mK was measured at a base temperature of 11 K. b. A temperature stability of ±2.0 mK was measured at an intermediate temperature of 110 K. Target temperature and high temperature stability were held for many hours.
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Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Physics of Superconductivity and Magnetism · Quantum and electron transport phenomena

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Rowland Institute at Harvard University , Cambridge, MA , United States

Department of Mechanical Engineering, University of Michigan , Ann Arbor, MI , United States

Department of Materials Science and Engineering, University of Michigan , Ann Arbor, MI , United States

References (8)

Show source-provided references
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