journal article·2022-08-01

Electron Beam Damage Mechanisms in Solution Phase Electron Microscopy of Metal-Organic Frameworks

Karthikeyan Gnanasekaran, Roberto dos Reis, Nathan Gianneschi

Microscopy and Microanalysis· Volume 28· Issue S1
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Abstract

Karthikeyan Gnanasekaran, Roberto dos Reis, Nathan Gianneschi; Electron Beam Damage Mechanisms in Solution Phase Electron Microscopy of Metal-Organic Frame
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Anodic Oxide Films and Nanostructures

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Affiliations

International Institute for Nanotechnology, Northwestern University Department of Chemistry, , Evanston, IL, United States

International Institute for Nanotechnology, Northwestern University Department of Materials Science and Engineering, , Evanston, IL, United States

Northwestern University Atomic and Nanoscale Characterization Experimental (NUANCE) Center, Northwestern University , Evanston, IL, United States

References (3)

Show source-provided references
1. Gong · J. Am. Chem. Soc · 2020 · 14210.1021/jacs.0c08773 ↗
2. Chen · Adv. Mater · 2020 · 3210.1002/adma.201907619 ↗
3. Ophus · Microsc. Microanal · 2019 · 2510.1017/S1431927619000497 ↗