A scheme to correct for inaccuracies in the compositional analysis of SixGe1-x by Atom Probe Tomography
Source abstract
Abstract
Masoud Dialameh, Jeroen Scheerder, Richard J H Morris, Johan Meersschaut, Olivier Richard, Wilfried Vandervorst, Paul van der Heide, Claudia Fleischmann; A
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Hydrogen embrittlement and corrosion behaviors in metals · Metal Extraction and Bioleaching
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (7)
Show source-provided references
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6. Composition of Wide Bandgap Semiconductor Materials and Nanostructures Measured by Atom Probe Tomography and Its Dependence on the Surface Electric Field10.1021/jp5071264 ↗
7. Gate-All-Around Transistors Based on Vertically Stacked Si Nanowires10.1149/07705.0019ecst ↗