Material Contrast Information at the limit: Imaging of energy related materials with Backscattered Electrons obtained with Field Emission and the DELTA SEM
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Abstract
Ute Golla-Schindler, Irene Wacker, Bernd Schindler, Ralf Löffler, Dagmar Goll, Gerhard Schneider, Rasmus R Schröder; Material Contrast Information at the l
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advancements in Battery Materials · Integrated Circuits and Semiconductor Failure Analysis
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References (5)
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1. Golla-Schindler · Micron · 2018 · 113 · 1010.1016/j.micron.2018.06.013 ↗
2. Golla-Schindler · Microscopy and Microanalysis · 2019 · 25 · 44810.1017/S1431927619002976 ↗
3. [5] We thank the Centre for Advanced Materials and ZEISS GmbH for the DELTA images. I. Wacker is member and R,R. Schröder is PI of the Cluster of Excellence “3D Matter Made to Order” (EXC-2082/1 – 390761711) under Germany's Excellence Strategy.
4. Böngeler · Scanning · 1993 · 15 · 110.1002/sca.4950150102 ↗
5. Schröder · Microscopy and Microanalysis · 2018 · 24 · 62610.1017/S1431927618003628 ↗