TEM Imaging of Edges and Point Defects in Monolayer Phosphorene
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Abstract
Yangjin Lee, Sol Lee, Jun-Yeong Yoon, Jinwoo Cheon, Hu Young Jeong, Kwanpyo Kim; TEM Imaging of Edges and Point Defects in Monolayer Phosphorene, Microscop
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: 2D Materials and Applications · MXene and MAX Phase Materials · Graphene research and applications
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References (4)
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1. [4] The authors acknowledge funding from the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (NRF-2017R1A5A1014862, NRF-2018R1A2B6008104) and the Institute for Basic Science (IBS-R026-D1).
2. 10.1021/acs.nanolett.9b0429210.1021/acs.nanolett.9b04292 ↗
3. 10.1073/pnas.141658111210.1073/pnas.1416581112 ↗
4. 10.1088/1361-6463/aa558310.1088/1361-6463/aa5583 ↗