Improvements in Low Voltage PFIB for Sample Preparation and Large Volume Serial Sectioning Tomography
Source abstract
Abstract
Brandon van Leer, Lee Casalena, Jeremy Graham, Bartlomiej Winiarski; Improvements in Low Voltage PFIB for Sample Preparation and Large Volume Serial Sectio
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Infective Endocarditis Diagnosis and Management · Electron and X-Ray Spectroscopy Techniques
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References (4)
Show source-provided references
1. Winiarski · Microscopy and Microanalysis · 2019 · 25
2. 10.1017/S143192760808129410.1017/S1431927608081294 ↗
3. [1] Tesch, P. , Proceedings from the 34th Inter. Symposium for Testing and Failure Analysis (2008).
4. Van Leer · Microscopy and Microanalysis · 2019 · 25