npSCOPE: A New Instrument Combining SIMS Imaging, SE Imaging and Transmission Ion Microscopy for High Resolution In-situ Correlative Investigations
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Abstract
Olivier De Castro, Antje Biesemeier, Eduardo Serralta, Nico Klingner, Gregor Hlawacek, Peter Gnauck, Serge Duarte Pinto, Falk Lucas, Cecilia Bebeacua, Tom
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Ion-surface interactions and analysis · Electronic and Structural Properties of Oxides · Electrochemical Analysis and Applications
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References (9)
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1. [9] This project has received funding from the European Union's Horizon 2020 Research and Innovation Programme under grant agreement No. 720964.
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8. [6] Wirtz, T. , Dowsett, D. , Philipp, P. ; SIMS on the helium ion microscope: a powerful tool for high-resolution high sensitivity nano-analytics; Helium Ion Microscopy (2016), ed. G. Hlawacek, A. Golzhäuser, 297.
9. 10.1116/1.235796710.1116/1.2357967 ↗