STEM-EELS Imaging of Resonant Modes in Dielectric Silicon Nanostructures

Journal Article STEM-EELS Imaging of Resonant Modes in Dielectric Silicon Nanostructures Get access Valentin Flauraud, Valentin Flauraud Electron Spectrometry and Microscopy Laboratory (LSME), Institute of Physics (IPHYS), Ecole Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland Search for other works by this author on: Oxford Academic Google Scholar Duncan TL Alexander Duncan TL Alexander Electron Spectrometry and Microscopy Laboratory (LSME), Institute of Physics (IPHYS), Ecole Polytechnique Fédérale de Lausanne (EPFL), Lausanne, Switzerland Corresponding author: duncan.alexander@epfl.ch Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 634–635, https://doi.org/10.1017/S1431927619003908 Published: 01 August 2019