An Adaptive Sparse Sampling Scheme for Scanning Electron Microscopy using Delauney Triangulation
Bibliographic record
Abstract
No abstract is available for this record. The assistant can identify its topic from the title, but cannot infer the study’s results.
Source: Not provided · Quality: missing
Research context
OpenAlex topics: Image Processing Techniques and Applications · Optical measurement and interference techniques · Electron and X-Ray Spectroscopy Techniques
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. 10.1038/srep2535010.1038/srep25350 ↗
2. 10.1017/S143192761700143X10.1017/S143192761700143X ↗
3. Grosche · IEEE International Conference on Imaging Systems and Techniques · 2018 · 1