journal article·2019-08Open access

Development of in situ Imaging Capabilities in SEM and Their Applications

Y Hashimoto, A Muto, K Shigeto, H Ito, H Itabashi, M Ohno, T Saito, S Tachibana

Microscopy and Microanalysis· Volume 25· Issue S2

Abstract

Y Hashimoto, A Muto, K Shigeto, H Ito, H Itabashi, M Ohno, T Saito, S Tachibana; Development of in situ Imaging Capabilities in SEM and Their Applications,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques

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References (1)

Show source-provided references
1. 10.2355/isijinternational.ISIJINT-2015-53410.2355/isijinternational.ISIJINT-2015-534 ↗