Direct Measurement of Atom Diffusion Using Atom-Tracking STM
Source abstract
Abstract
B S Swartzentruber, R Stumpf, T R Mattsson, P J Feibelman; Direct Measurement of Atom Diffusion Using Atom-Tracking STM, Microscopy and Microanalysis, Volu
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Electrochemical Analysis and Applications · Nuclear Materials and Properties
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References
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