DataVXMicroscopy and MicroanalysisPaper
journal article·2018-08Open access

Strain Mapping Using EBSD Cross Correlation and Raman Methods

M.D. Vaudin, AJ Gayle, L.H. Friedman, R.F. Cook

Microscopy and Microanalysis· Volume 24· Issue S1
Publisher pageOpen full text
Source abstract

Abstract

MD Vaudin, AJ Gayle, LH Friedman, RF Cook; Strain Mapping Using EBSD Cross Correlation and Raman Methods, Microscopy and Microanalysis, Volume 24, Issue S1
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced Surface Polishing Techniques · Mineral Processing and Grinding · Integrated Circuits and Semiconductor Failure Analysis

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (5)

Show source-provided references
1. 10.1016/j.ultramic.2016.02.00110.1016/j.ultramic.2016.02.001 ↗
2. 10.1016/j.ultramic.2014.09.00710.1016/j.ultramic.2014.09.007 ↗
3. 10.1016/j.ultramic.2013.08.00610.1016/j.ultramic.2013.08.006 ↗
4. 10.1063/1.500127010.1063/1.5001270 ↗
5. 10.1179/174328406X13096610.1179/174328406X130966 ↗