Environmental Real Time Imaging with 200kV FE Aberration-corrected Analytical Scanning Transmission Electron Microscope (ESTEM) System with an Open Window Gas Injection
Source abstract
Abstract
H Inada, H Kikuchi, A Hanawa, Y Suzuki, M Shirai, K Nakamura; Environmental Real Time Imaging with 200kV FE Aberration-corrected Analytical Scanning Transm
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
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References (5)
Show source-provided references
1. Microsc. Microanal · 2016 · 22 · 32
2. 10.1017/S143192761700525610.1017/S1431927617005256 ↗
3. European Microsc. Congress · 2016 · 1 · 334
4. Microsc. Microanal · 2013 · 27 · 11
5. 10.1038/nmat253210.1038/nmat2532 ↗