Quantification of Bonded Ni Atoms for M-M0S2 Metallic Contact through X-ray Photoemission Electron Microscopy
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Source: openalex_inverted_index · Quality: short
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OpenAlex topics: Machine Learning in Materials Science · 2D Materials and Applications · Molecular Junctions and Nanostructures
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References (7)
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1. 10.1021/nn506567r10.1021/nn506567r ↗
2. 10.1038/nmat408010.1038/nmat4080 ↗
3. 10.1038/nmat445210.1038/nmat4452 ↗
4. 10.1002/smll.20170452610.1002/smll.201704526 ↗
5. 10.3390/cryst801002410.3390/cryst8010024 ↗
6. 10.1016/j.matchemphys.2015.03.04110.1016/j.matchemphys.2015.03.041 ↗
7. 10.1063/1.473875410.1063/1.4738754 ↗