Electromigration of Copper in Lithographically-Defined Aluminum Nanowires
Source abstract
Abstract
Brian Zutter, Matthew Mecklenburg, Shaul Aloni, B C Regan; Electromigration of Copper in Lithographically-Defined Aluminum Nanowires, Microscopy and Microa
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Copper Interconnects and Reliability · Anodic Oxide Films and Nanostructures · Molecular Junctions and Nanostructures
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (5)
Show source-provided references
1. Physica Status Solidi · 1981 · (A) · 363
2. 10.1007/BF0265454910.1007/BF02654549 ↗
3. MRS Online Proceedings Library Archive. · 1996 · 428
4. 10.1063/1.12397410.1063/1.123974 ↗
5. 10.1147/rd.144.046110.1147/rd.144.0461 ↗