Optimizing Van der Waals Forces For FIB ex situ Lift Out
Source abstract
Abstract
Lucille A Giannuzzi, Trevor Clark; Optimizing Van der Waals Forces For FIB ex situ Lift Out, Microscopy and Microanalysis, Volume 23, Issue S1, 1 July 2017
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Advanced Electron Microscopy Techniques and Applications · Advanced Materials Characterization Techniques
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References (4)
Show source-provided references
1. Giannuzzi · Microsc. Microanal. · 2015 · 21 · 1032
2. 10.1017/S143192760909289710.1017/S1431927609092897 ↗
3. https://en.wikipedia.org/wiki/Permanent_marker.
4. FIB work was performed on a FIB 200 in collaboration with TSS Microscopy.