Quantitative Electron Probe Microanalysis of Fe at Low Accelerating Voltage Using the Lα and Lβ X-ray Lines
Source abstract
Abstract
Aurélien Moy, John Fournelle; Quantitative Electron Probe Microanalysis of Fe at Low Accelerating Voltage Using the Lα and Lβ X-ray Lines, Microscopy and M
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · X-ray Spectroscopy and Fluorescence Analysis · Advanced Materials Characterization Techniques
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References (5)
Show source-provided references
1. Pouchou · 31
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4. 10.1127/ejm/6/3/040710.1127/ejm/6/3/0407 ↗
5. 10.1017/S143192761601183110.1017/S1431927616011831 ↗