Picometer-Precision Strain Mapping of Two-Dimensional Heterostructures using an Electron Microscope Pixel Array Detector (EMPAD)
Source abstract
Abstract
Yimo Han, Saien Xie, Kayla Nguyen, Michael Cao, Mark W Tate, Prafull Purohit, Sol M Gruner, Jiwoong Park, David A Muller; Picometer-Precision Strain Mappin
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Ga2O3 and related materials
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References (7)
Show source-provided references
1. 10.1017/S143192761600507910.1017/S1431927616005079 ↗
2. 10.1017/S143192761600519510.1017/S1431927616005195 ↗
3. 10.1021/acsnano.6b0287910.1021/acsnano.6b02879 ↗
4. 10.1038/nnano.2016.11510.1038/nnano.2016.115 ↗
5. 10.1126/science.aab409710.1126/science.aab4097 ↗
6. 10.1017/S143192761501566410.1017/S1431927615015664 ↗
7. Work supported by the CCMR, an NSF MRSEC (DMR-1120296).