Energy Filtered STEM Imaging at 30kV and Below - A New Window into the Nano-World?
Source abstract
Abstract
Takeshi Sunaoshi, Manabu Shirai, Satoshi Okada, Kazutoshi Kaji, Edgar Voelkl; Energy Filtered STEM Imaging at 30kV and Below - A New Window into the Nano-W
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (5)
Show source-provided references
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4. 10.1016/j.ultramic.2014.09.01210.1016/j.ultramic.2014.09.012 ↗
5. 10.1017/S143192760488238210.1017/S1431927604882382 ↗