SIMS on FIB Instruments: a Powerful Tool for High-Resolution High-Sensitivity Nano-Analytics
Source abstract
Abstract
T Wirtz, D Dowsett, P Philipp, J-N Audinot, S Eswara Moorthy; SIMS on FIB Instruments: a Powerful Tool for High-Resolution High-Sensitivity Nano-Analytics,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Ion-surface interactions and analysis · Analytical chemistry methods development · Bacterial Identification and Susceptibility Testing
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. Appl. Surf Sci. · 2013 · 282 · 90
2. 10.1016/j.ijms.2006.02.01810.1016/j.ijms.2006.02.018 ↗
3. 10.1063/1.473924010.1063/1.4739240 ↗