Rigorous Quantitative SEM/EDS Microanalysis Requires Careful Inspection of the Peak-Fitting Residual Spectrum to Reveal Hidden Constituents
Source abstract
Abstract
Dale E Newbury, Nicholas W M Ritchie; Rigorous Quantitative SEM/EDS Microanalysis Requires Careful Inspection of the Peak-Fitting Residual Spectrum to Reve
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques · Ion-surface interactions and analysis
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References (1)
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1. 10.1007/s10853-014-8685-210.1007/s10853-014-8685-2 ↗