Annular Bright Field Scanning Transmission Electron Microscopy - Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials
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Abstract
Journal Article Annular Bright Field Scanning Transmission Electron Microscopy - Direct and Robust Atomic-Resolution Imaging of Light Elements in Crystalline Materials Get access Scott D Findlay Scott D Findlay School of Physics and Astronomy, Monash University, Melbourne, Australia Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 1939–1940, https://doi.org/10.1017/S1431927615010478 Published: 23 September 2015
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OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Force Microscopy Techniques and Applications
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References (12)
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