Improving the SNR of Atomic Resolution STEM EELS & EDX Mapping while Reducing Beam-damage by using Non-rigid Spectrum-image Averaging
Source abstract
Abstract
Lewys Jones, Richard Beanland, Sergio Lozano-Perez, Karim Baba-kishi, Peter D Nellist; Improving the SNR of Atomic Resolution STEM EELS & EDX Mapping w
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Integrated Circuits and Semiconductor Failure Analysis · Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques
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References (2)
Show source-provided references
1. 10.1016/j.micron.2004.02.00310.1016/j.micron.2004.02.003 ↗
2. 10.1017/S143192761300140210.1017/S1431927613001402 ↗