Atomic Scale Characterization of Oxygen Vacancy Dynamics by In -Situ Reduction and Analytical Atomic Resolution STEM
Source abstract
Abstract
RF Klie, N D Browning, Y Zhu; Atomic Scale Characterization of Oxygen Vacancy Dynamics by In -Situ Reduction and Analytical Atomic Resolution STEM, Microsc
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Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis
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