Dislocation Imaging by Precession Electron Diffraction
Source abstract
Abstract
Journal Article Dislocation Imaging by Precession Electron Diffraction Get access Dexin Zhao, Dexin Zhao Texas A&M University, College Station, Texas, United States Search for other works by this author on: Oxford Academic Google Scholar Kelvin Y Xie Kelvin Y Xie Texas A&M University, College Station, Texas, United States Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 26, Issue S2, 1 August 2020, Pages 226–227, https://doi.org/10.1017/S1431927620013872 Published: 01 August 2020
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Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications
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References (7)
Show source-provided references
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