Focused Ion Beam Sample Preparation for High Temperature In-situ Transmission Electron Microscopy Experiments: Use Carbon for Now
Source abstract
Abstract
Jules Gardener, Austin Akey, Daan Hein Alsem, David Bell; Focused Ion Beam Sample Preparation for High Temperature In-situ Transmission Electron Microscopy
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · X-ray Spectroscopy and Fluorescence Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References (3)
Show source-provided references
1. 10.1017/S143192761600059310.1017/S1431927616000593 ↗
2. 10.1002/jemt.2267510.1002/jemt.22675 ↗
3. Flathmann · Phys. Status Solidi A · 2019