journal article·2019-08Open access

Imaging Low Z Materials in Crystalline Environments Via Scanning Transmission Electron Microscopy

SD Findlay, N Shibata, Y Ikuhara, L Clark, HG Brown, TC Petersen, DM Paganin, MJ Morgan

Microscopy and Microanalysis· Volume 25· Issue S2

Abstract

Journal Article Imaging Low Z Materials in Crystalline Environments Via Scanning Transmission Electron Microscopy Get access SD Findlay, SD Findlay School of Physics and Astronomy, Monash University, Melbourne, Australia Corresponding author: scott.findlay@monash.edu Search for other works by this author on: Oxford Academic Google Scholar N Shibata, N Shibata Institute of Engineering Innovation, The University of Tokyo, Tokyo, Japan Search for other works by this author on: Oxford Academic Google Scholar Y Ikuhara, Y Ikuhara Institute of Engineering Innovation, The University of Tokyo, Tokyo, Japan Search for other works by this author on: Oxford Academic Google Scholar L Clark, L Clark School of Physics and Astronomy, University of Glasgow, Glasgow, UK Search for other works by this author on: Oxford Academic Google Scholar HG Brown, HG Brown National Centre for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, USA Search for other works by this author on: Oxford Academic Google Scholar TC Petersen, TC Petersen School of Physics and Astronomy, Monash University, Melbourne, Australia Search for other works by this author on: Oxford Academic Google Scholar DM Paganin, DM Paganin School of Physics and Astronomy, Monash University, Melbourne, Australia Search for other works by this author on: Oxford Academic Google Scholar MJ Morgan MJ Morgan School of Physics and Astronomy, Monash University, Melbourne, Australia Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 1732–1733, https://doi.org/10.1017/S1431927619009395 Published: 01 August 2019
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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advanced X-ray Imaging Techniques

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References (12)

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1. This research was supported under the Australian Research Council Discovery Projects funding scheme (Project No. DP160102338). We thank all our collaborators who have contributed so much to the various pieces of research overviewed in this talk.
2. 10.1016/j.ultramic.2015.09.00210.1016/j.ultramic.2015.09.002 ↗
3. 10.1103/PhysRevLett.108.07390110.1103/PhysRevLett.108.073901 ↗
4. 10.1016/j.ultramic.2015.10.01110.1016/j.ultramic.2015.10.011 ↗
5. 10.1038/ncomms665310.1038/ncomms6653 ↗
6. 10.1016/j.ultramic.2010.04.00410.1016/j.ultramic.2010.04.004 ↗
7. 10.1038/s41586-018-0298-510.1038/s41586-018-0298-5 ↗
8. 10.1063/1.489288410.1063/1.4892884 ↗
9. 10.1017/S143192760909389110.1017/S1431927609093891 ↗
10. 10.1016/j.ultramic.2013.07.01910.1016/j.ultramic.2013.07.019 ↗
11. 10.1016/j.ultramic.2016.05.00410.1016/j.ultramic.2016.05.004 ↗
12. 10.1038/ncomms1253210.1038/ncomms12532 ↗