Magnetic Sector SIMS System with Continuous Focal Plane Detector for Advanced Analytical Capabilities on FIB Instruments
Source abstract
Abstract
Tom Wirtz, Olivier De Castro, Antje Biesemeier, Hung Quang Hoang, Jean-Nicolas Audinot; Magnetic Sector SIMS System with Continuous Focal Plane Detector fo
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications
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References (6)
Show source-provided references
1. [6] This project has received funding from the European Union's Horizon 2020 Research and Innovation Programme under grant agreement No. 720964.
2. 10.1021/acs.analchem.7b0148110.1021/acs.analchem.7b01481 ↗
3. 10.1146/annurev-anchem-061318-11545710.1146/annurev-anchem-061318-115457 ↗
4. 10.1088/0957-4484/26/43/43400110.1088/0957-4484/26/43/434001 ↗
5. 10.1021/acs.analchem.7b0125610.1021/acs.analchem.7b01256 ↗
6. Wirtz · Helium Ion Microscopy · 2017