The Analysis of Sensitive Materials Using EBSD: The Importance of Beam Conditions and Detector Sensitivity

Journal Article The Analysis of Sensitive Materials Using EBSD: The Importance of Beam Conditions and Detector Sensitivity Get access Pat Trimby, Pat Trimby Oxford Instruments Nanoanalysis, Halifax Road, High Wycombe, UK Corresponding author: pat.trimby@oxinst.com Search for other works by this author on: Oxford Academic Google Scholar Angus Bewick, Angus Bewick Oxford Instruments Nanoanalysis, Halifax Road, High Wycombe, UK Search for other works by this author on: Oxford Academic Google Scholar Daniel Abou-Ras, Daniel Abou-Ras Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Berlin, Germany Search for other works by this author on: Oxford Academic Google Scholar Pietro Caprioglio, Pietro Caprioglio Institut für Physik und Astronomie, Universität Potsdam, Potsdam-Golm, Germany Search for other works by this author on: Oxford Academic Google Scholar Dieter Neher, Dieter Neher Institut für Physik und Astronomie, Universität Potsdam, Potsdam-Golm, Germany Search for other works by this author on: Oxford Academic Google Scholar Laura Otter Laura Otter Department of Earth & Planetary Science, Macquarie University, Sydney, Australia Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 25, Issue S2, 1 August 2019, Pages 2394–2395, https://doi.org/10.1017/S1431927619012704 Published: 01 August 2019