Examination of the Structural Quality of InAsSbBi Epilayers using Cross Section Transmission Electron Microscopy
Source abstract
Abstract
Rajeev R Kosireddy, Stephen T Schaefer, Arvind J Shalindar, Preston T Webster, Shane R Johnson; Examination of the Structural Quality of InAsSbBi Epilayers
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Semiconductor Quantum Structures and Devices · Nanowire Synthesis and Applications · Photonic and Optical Devices
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References (1)
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1. 10.1063/1.499484710.1063/1.4994847 ↗