Developments in Large Volume 3D Analysis via P-FIB: EBSD & EDS

J. Lindsay; T.L. Burnett; J. Goulden; P. Frankel; A. Garner; B. Winiarski; P. J Withers

doi:10.1017/s1431927617002100

journal article·2017-07Open access

Developments in Large Volume 3D Analysis via P-FIB: EBSD & EDS

J. Lindsay, T.L. Burnett, J. Goulden, P. Frankel, A. Garner, B. Winiarski, P. J Withers

Microscopy and Microanalysis· Volume 23· Issue S1

Publisher page Open full text

Source abstract

Abstract

J Lindsay, TL Burnett, J Goulden, P Frankel, A Garner, B Winiarski, P J Withers; Developments in Large Volume 3D Analysis via P-FIB: EBSD & EDS, Micros

Only a short abstract or summary was supplied by the source.

Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced Materials Characterization Techniques · Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

References (4)

Show source-provided references

1. Burnett · Microscopy and Microanalysis · 2016 · 22 · 83810.1017/S1431927616005031 ↗

2. 10.1016/j.actamat.2013.05.00810.1016/j.actamat.2013.05.008 ↗

3. Winiarski · Book Series: Conference Proceedings of the SEM Series, Springer · 2016 · Vol. 9 · 215

4. 10.1016/j.ultramic.2015.11.00110.1016/j.ultramic.2015.11.001 ↗