journal article·2014-10

A Proposal for Improved Helium Microscopy

Frederick W. Martin

Microscopy and Microanalysis· Volume 20· Issue 5
Publisher page

Abstract

Abstract Elimination of the electrostatic objective lens and alternative use of a Cc- and Cs-corrected quadrupole doublet may increase the useful working distance of the helium microscope, improve its resolution from 3 to 0.3 Å, and improve its optimum convergence angle from 0.4 to 4 mrad.
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Research context

OpenAlex topics: Quantum, superfluid, helium dynamics · Surface and Thin Film Phenomena · Physics of Superconductivity and Magnetism

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References (29)

Show source-provided references
1. 10.1016/j.ijleo.2005.03.00110.1016/j.ijleo.2005.03.001 ↗
2. 10.1038/nature1144910.1038/nature11449 ↗
3. Hill · 2012 · 77ff
4. Abbildungseigenschaften sphärisch korrigierter electronenoptischer Achromate
5. 10.1103/PhysRevA.32.82910.1103/PhysRevA.32.829 ↗
6. 10.1017/S143192761300393010.1017/S1431927613003930 ↗
7. 10.1063/1.157253910.1063/1.1572539 ↗
8. 10.1016/0168-583X(95)00400-910.1016/0168-583X(95)00400-9 ↗
9. 10.1002/sca.2023910.1002/sca.20239 ↗
10. Simultaneous compensation of 2nd-order parasitic aberrations in both principal sections of an achromatic quadrupole lens doublet
11. Spharische und chromatische Korrectur von Electronen-Linsen
12. Martin F.W. (2012). A large-aperture ion-beam lens corrected for both chromatic and spherical aberration. Abstracts Archive for the International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication (EIPBN12), poster P07-08. Available at http:// eipbn.omnibooksonline.com (retrieved 2013-06-03).
13. 10.1063/1.481624810.1063/1.4816248 ↗
14. 10.1017/S143192761201261510.1017/S1431927612012615 ↗
15. Allgemeine Abblildungseigenschaften unrunder Elektronenlinsen mit gerader Achse
16. 10.1016/j.bpj.2011.08.02810.1016/j.bpj.2011.08.028 ↗
17. 10.1016/j.nimb.2012.11.04710.1016/j.nimb.2012.11.047 ↗
18. Zach J. (2003). Method for detecting geometrical-optical aberrations. US Patent 20030001102.
19. 10.1016/0168-9002(95)00056-910.1016/0168-9002(95)00056-9 ↗
20. Uber den spharischen und den chromatischen Fehler unrunder Elektronenlinsen
21. 10.1017/S143192761300796410.1017/S1431927613007964 ↗
22. Achromatic quadrupole electron lenses
23. Martin F.W. (2013 a). Particle-beam column corrected for both chromatic and spherical aberration. US Patent application 13,849496, laid open October 10, 2013.
24. Krivanek O.L. , Dellby N. & Lupini A.R. (2003). Auto adjusting charged-particle probe-forming apparatus. US Patent 6,552,340 B1.
25. 10.1063/1.170911310.1063/1.1709113 ↗
26. 10.1016/S0304-3991(98)00048-510.1016/S0304-3991(98)00048-5 ↗
27. Ward · Helium ion microscope: A new tool for nanoscale microscopy and metrology · 2006
28. Ein elektrisch-magnetisches Octopol-Element zur sphärischen und chromatischen Korrector von Elektronenlinsen
29. 10.1016/j.ijleo.2013.08.01310.1016/j.ijleo.2013.08.013 ↗