EBSD Pattern Collection and Orientation Mapping at Normal Incidence to the Electron Beam
Source abstract
Abstract
J K Farrer, M M Nowell, Damian J Dingley, David J Dingley; EBSD Pattern Collection and Orientation Mapping at Normal Incidence to the Electron Beam, Micros
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advancements in Photolithography Techniques · Advanced Electron Microscopy Techniques and Applications
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
Reference metadata was not supplied for this record.