journal article·2010-07Open access

Fast mechanical shutter in Hitachi HF 3300, a 60 kV to 300 kV TEM

M Malac, RA McLeod, P Li, WC Bigelow, JY Howe, LF Allard, Y Taniguchi, MS Moreno

Microscopy and Microanalysis· Volume 16· Issue S2

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Only a short abstract or summary was supplied by the source.
Source: crossref · Quality: short

Research context

OpenAlex topics: Ion-surface interactions and analysis · Advanced Materials Characterization Techniques · Advanced Electron Microscopy Techniques and Applications

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References

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