journal article·2007-08

Simulation of Electron Backscatter Diffraction Patterns

A Winkelmann

Microscopy and Microanalysis· Volume 13· Issue S02
Publisher page

Abstract

Journal Article Simulation of Electron Backscatter Diffraction Patterns Get access A Winkelmann A Winkelmann Max-Planck-Institut für Mikrostrukturphysik,Germany Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 13, Issue S02, 1 August 2007, Pages 930–931, https://doi.org/10.1017/S1431927607072546 Published: 05 August 2007
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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Non-Destructive Testing Techniques · Integrated Circuits and Semiconductor Failure Analysis

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References

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