DataVXMicroscopy and MicroanalysisPaper
journal article·2019-08Open access

Improved 4D-STEM Strain Mapping Precision Using Patterned Probes

Steven E. Zeltmann, Alexander Müller, Karen C. Bustillo, Benjamin H. Savitzky, Andrew M Minor, Colin Ophus

Microscopy and Microanalysis· Volume 25· Issue S2
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OpenAlex topics: Non-Destructive Testing Techniques · Welding Techniques and Residual Stresses · Advanced Surface Polishing Techniques

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References (5)

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1. 10.1016/j.ultramic.2015.06.01110.1016/j.ultramic.2015.06.011 ↗
2. 10.1063/1.492299410.1063/1.4922994 ↗
3. S.Z. was supported by STROBE: A National Science Foundation Science & Technology Center under Grant No. DMR 1548924. B.S was supported by Toyota Research Institute. Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231.
4. https://github.com/bsavitzky/py4DSTEM
5. 10.1016/j.ultramic.2016.12.02110.1016/j.ultramic.2016.12.021 ↗