Focused Ion Beam Based Sample Preparation Techniques
Source abstract
Abstract
R M Langford, A K Petford-Long, P Gnauck; Focused Ion Beam Based Sample Preparation Techniques, Microscopy and Microanalysis, Volume 8, Issue S02, 1 August
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Ion-surface interactions and analysis · Electron and X-Ray Spectroscopy Techniques · Integrated Circuits and Semiconductor Failure Analysis
SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.
References
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