Atom Probe Tomography: A Technique for Nanoscale Characterization
Source abstract
Abstract
M K Miller, E A Kenik; Atom Probe Tomography: A Technique for Nanoscale Characterization, Microscopy and Microanalysis, Volume 8, Issue S02, 1 August 2002,
Only a short abstract or summary was supplied by the source.
Source: openalex_inverted_index · Quality: short
Research context
OpenAlex topics: Advanced Materials Characterization Techniques · Diamond and Carbon-based Materials Research · Ion-surface interactions and analysis
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References
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