journal article·1997-08-01

Multivariate Statistical Analysis of Spectrum Lines and Images

Ian M Anderson, Jim Bentley

Microscopy and Microanalysis· Volume 3· Issue S2
Publisher page

Abstract

Abstract Recent developments in instrumentation and computing power have greatly improved the potential for quantitative imaging and analysis. For example, products are now commercially available that allow the practical acquisition of spectrum images, where an EELS or EDS spectrum can be acquired from a sequence of positions on the specimen. However, such data files typically contain megabytes of information and may be difficult to manipulate and analyze conveniently or systematically. A number of techniques are being explored for the purpose of analyzing these large data sets. Multivariate statistical analysis (MSA) provides a method for analyzing the raw data set as a whole. The basis of the MSA method has been outlined by Trebbia and Bonnet. MSA has a number of strengths relative to other methods of analysis. First, it is broadly applicable to any series of spectra or images. Applications include characterization of grain boundary segregation (position-), of channeling-enhanced microanalysis (orientation-), or of beam damage (time-variation of spectra).
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Research context

OpenAlex topics: Advanced Statistical Methods and Models · Statistical Methods and Inference · Statistical Methods and Bayesian Inference

SciVX discovery tags are terminology-based. OpenAlex topics are source-provided classifications.

Affiliations

Metals & Ceramics Division, Oak Ridge National Laboratory , P.O. Box 2008, Oak Ridge, TN, 37831

References (6)

Show source-provided references
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2. Titchmarsh · J. Microscopy · 1996 · 184 · 19510.1046/j.1365-2818.1996.1400698.x ↗
3. Bentley · 1996 · 53210.1017/S0424820100165124 ↗
4. Anderson · Mater. Res. Soc. Symp. Proc. · 1997 · 458
5. Anderson · 1996 · 55010.1017/S0424820100165215 ↗
6. Rice