DataVXMicroscopy and MicroanalysisPaper
journal article·2002-08Open access

Monochromized 200kV (S)TEM

P.C. Tiemeijer, J.H.A van Lin, B.H. Freitag, A.F. de Jong

Microscopy and Microanalysis· Volume 8· Issue S02
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Source abstract

Abstract

PC Tiemeijer, JHA van Lin, BH Freitag, AF de Jong; Monochromized 200kV (S)TEM, Microscopy and Microanalysis, Volume 8, Issue S02, 1 August 2002, Pages 70–7
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Source: openalex_inverted_index · Quality: short

Research context

OpenAlex topics: Advanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Ion-surface interactions and analysis

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