A New Fully Integrated Retractable 4D STEM Detector for Scanning Electron Microscopes Using Timepix3 Based Pixelated Detector
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Abstract
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Research context
OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advancements in Photolithography Techniques
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Affiliations
TESCAN Group, R&D Department , Brno , Czech Republic
AdvaScope, R&D Department , Brno , Czech Republic
Brno University of Technology , CEITEC, Brno , Czech Republic
Brno University of Technology, Institute of Physical Engineering , Brno , Czech Republic
References (1)
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1. Ophus · Microscopy and Microanalysis · 2019 · 25 · 56310.1017/S1431927619000497 ↗