journal article·2024-07-24

A New Fully Integrated Retractable 4D STEM Detector for Scanning Electron Microscopes Using Timepix3 Based Pixelated Detector

Rastislav Motúz, Jaroslav Jiruše, Pavel Stejskal, Michal Horák, Tomáš Šikola

Microscopy and Microanalysis· Volume 30· Issue Supplement_1
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Abstract

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Research context

OpenAlex topics: Electron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · Advancements in Photolithography Techniques

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Affiliations

TESCAN Group, R&D Department , Brno , Czech Republic

AdvaScope, R&D Department , Brno , Czech Republic

Brno University of Technology , CEITEC, Brno , Czech Republic

Brno University of Technology, Institute of Physical Engineering , Brno , Czech Republic

References (1)

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1. Ophus · Microscopy and Microanalysis · 2019 · 25 · 56310.1017/S1431927619000497 ↗