Low Voltage Scanning Transmission Electron Microscopy as a Viable Tool for Routine Analysis of Materials Science Specimens
Bibliographic record
Abstract
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Research context
OpenAlex topics: Force Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Non-Destructive Testing Techniques
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Affiliations
Department of Mining and Material Engineering, McGill University , Montréal, Québec , Canada
References (5)
Show source-provided references
1. Golla · Journal of Microscopy · 1994 · 173 · 21910.1111/j.1365-2818.1994.tb03444.x ↗
2. Morandi · Journal of applied physics · 2007 · 101 · 11491710.1063/1.2745333 ↗
3. Probst · Micron · 2007 · 38 · 40210.1016/j.micron.2006.06.009 ↗
4. Konno · Ultramicroscopy · 2014 · 145 · 2810.1016/j.ultramic.2013.09.001 ↗
5. Brodusch · Microscopy and Microanalysis · 2021 · 27 · 131810.1017/S143192762100492X ↗